东莞市志信电子仪器有限公司。。。。。。。{专业二手仪器买卖}
销售。E6607C回收热线:唐先生13688962304。。。。静候您的来电。。Q Q。136583266
地址:广东省东莞市塘厦镇塘厦大道76号
专业销售。回收。。全新 / 二手 。。。仪器仪表。
现货供应。诚信经营。。中介有酬。。。因为自信,所以成功。。
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主要特性与技术指标
Add multi-format standards-based calibration and verification test support as
needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA,
WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer
measurements science
Simplify signal creation to synchronize, control, and test your wireless device
with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with
Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device
calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern
chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple
measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and
balancing
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched
transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external
multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration
in manufacturing
Add external display, mouse, and keyboard, for full manual control and
functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-
signaling test