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首页 > 新闻中心 > 长期回收安捷伦E6607C
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长期回收安捷伦E6607C
发布时间:2017-02-17        浏览次数:5        返回列表
 E6607C无线测试仪

东莞市志信电子仪器有限公司。。。。。。。{专业二手仪器买卖}                  
               
销售。E6607C回收热线:唐先生13688962304。。。。静候您的来电。。Q Q。136583266    
             
地址:广东省东莞市塘厦镇塘厦大道76号
 
专业销售。回收。。全新 / 二手 。。。仪器仪表。
 
现货供应。诚信经营。。中介有酬。。。因为自信,所以成功。。
 
用爱心来做事,用感恩的心做人。您的需要,我的服务!志信仪器为您的生活提供无限的支持
 
 
主要特性与技术指标
Add multi-format standards-based calibration and verification test support as 
 
needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA, 
 
WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer 
 
measurements science
Simplify signal creation to synchronize, control, and test your wireless device 
 
with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with 
 
Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device 
 
calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern 
 
chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple 
 
measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and 
 
balancing
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched 
 
transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external 
 
multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration 
 
in manufacturing
Add external display, mouse, and keyboard, for full manual control and 
 
functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-
 
signaling test